From 75d22b323fad49715068f74af9e65dbaba06614e Mon Sep 17 00:00:00 2001 From: Johan Hovold Date: Thu, 21 Mar 2013 12:36:34 +0100 Subject: [PATCH] USB: keyspan_pda: remove bogus disconnect test in close Remove bogus (and unnecessary) test for serial->dev being NULL in close. The device is never cleared, and close is never called after a completed disconnect anyway. Signed-off-by: Johan Hovold Signed-off-by: Greg Kroah-Hartman --- drivers/usb/serial/keyspan_pda.c | 9 ++------- 1 file changed, 2 insertions(+), 7 deletions(-) diff --git a/drivers/usb/serial/keyspan_pda.c b/drivers/usb/serial/keyspan_pda.c index 0d992ba7bd05..da3b29eb605c 100644 --- a/drivers/usb/serial/keyspan_pda.c +++ b/drivers/usb/serial/keyspan_pda.c @@ -649,13 +649,8 @@ error: } static void keyspan_pda_close(struct usb_serial_port *port) { - struct usb_serial *serial = port->serial; - - if (serial->dev) { - /* shutdown our bulk reads and writes */ - usb_kill_urb(port->write_urb); - usb_kill_urb(port->interrupt_in_urb); - } + usb_kill_urb(port->write_urb); + usb_kill_urb(port->interrupt_in_urb); } -- 2.30.2