From: Masahiro Yamada Date: Fri, 26 Dec 2014 13:20:57 +0000 (+0900) Subject: mtd: nand: Mark the BBT as scanned prior to calling scan_bbt again X-Git-Url: http://git.lede-project.org./?a=commitdiff_plain;h=bf80ee6e1d73be046a7c5454c7e7493e7a6ea5e0;p=project%2Fbcm63xx%2Fu-boot.git mtd: nand: Mark the BBT as scanned prior to calling scan_bbt again Commit 35c204d8a9d0 (nand: reinstate lazy bad block scanning) broke NAND_BBT_USE_FLASH feature. Its git-log claimed that it reinstated the change as by commit fb49454b1b6c ("nand: reinstate lazy bad block scanning"), but it moved "chip->options |= NAND_BBT_SCANNED" below "chip->scan_bbt(mtd);". It causes recursion if scan_bbt does not find a flash based BBT and tries to write one, and the attempt to erase the BBT area causes a bad block check. Reinstate commit ff49ea8977b5 (NAND: Mark the BBT as scanned prior to calling scan_bbt.). Signed-off-by: Masahiro Yamada Cc: Rostislav Lisovy Cc: Heiko Schocher Cc: Scott Wood --- diff --git a/drivers/mtd/nand/nand_base.c b/drivers/mtd/nand/nand_base.c index d04c7ea0ae..eaa4be1506 100644 --- a/drivers/mtd/nand/nand_base.c +++ b/drivers/mtd/nand/nand_base.c @@ -635,8 +635,8 @@ static int nand_block_checkbad(struct mtd_info *mtd, loff_t ofs, int getchip, struct nand_chip *chip = mtd->priv; if (!(chip->options & NAND_BBT_SCANNED)) { - chip->scan_bbt(mtd); chip->options |= NAND_BBT_SCANNED; + chip->scan_bbt(mtd); } if (!chip->bbt)