From: David Woodhouse Date: Sat, 13 May 2006 15:14:26 +0000 (+0100) Subject: [MTD NAND] Reduce paranoia level when scanning for bad blocks on virgin chips X-Git-Url: http://git.lede-project.org./?a=commitdiff_plain;h=6943f8af7d6583be57d67bba8b2644371f6a10ca;p=openwrt%2Fstaging%2Fblogic.git [MTD NAND] Reduce paranoia level when scanning for bad blocks on virgin chips We were scanning for 0xFF through the entire chip -- which takes a while when it's a 512MiB device as I have on my current toy. The specs only say we need to check certain bytes -- so do only that. Signed-off-by: David Woodhouse --- diff --git a/drivers/mtd/nand/nand_bbt.c b/drivers/mtd/nand/nand_bbt.c index 32f063b6e9a5..ccc48a4a6ad0 100644 --- a/drivers/mtd/nand/nand_bbt.c +++ b/drivers/mtd/nand/nand_bbt.c @@ -981,14 +981,14 @@ static struct nand_bbt_descr largepage_memorybased = { }; static struct nand_bbt_descr smallpage_flashbased = { - .options = NAND_BBT_SCANEMPTY | NAND_BBT_SCANALLPAGES, + .options = NAND_BBT_SCAN2NDPAGE, .offs = 5, .len = 1, .pattern = scan_ff_pattern }; static struct nand_bbt_descr largepage_flashbased = { - .options = NAND_BBT_SCANEMPTY | NAND_BBT_SCANALLPAGES, + .options = NAND_BBT_SCAN2NDPAGE, .offs = 0, .len = 2, .pattern = scan_ff_pattern