return nand_block_markbad_lowlevel(mtd_to_nand(mtd), ofs);
}
-/**
- * nand_max_bad_blocks - [MTD Interface] Max number of bad blocks for an mtd
- * @mtd: MTD device structure
- * @ofs: offset relative to mtd start
- * @len: length of mtd
- */
-static int nand_max_bad_blocks(struct mtd_info *mtd, loff_t ofs, size_t len)
-{
- struct nand_chip *chip = mtd_to_nand(mtd);
- u32 part_start_block;
- u32 part_end_block;
- u32 part_start_die;
- u32 part_end_die;
-
- /*
- * max_bb_per_die and blocks_per_die used to determine
- * the maximum bad block count.
- */
- if (!chip->max_bb_per_die || !chip->blocks_per_die)
- return -ENOTSUPP;
-
- /* Get the start and end of the partition in erase blocks. */
- part_start_block = mtd_div_by_eb(ofs, mtd);
- part_end_block = mtd_div_by_eb(len, mtd) + part_start_block - 1;
-
- /* Get the start and end LUNs of the partition. */
- part_start_die = part_start_block / chip->blocks_per_die;
- part_end_die = part_end_block / chip->blocks_per_die;
-
- /*
- * Look up the bad blocks per unit and multiply by the number of units
- * that the partition spans.
- */
- return chip->max_bb_per_die * (part_end_die - part_start_die + 1);
-}
-
/**
* nand_suspend - [MTD Interface] Suspend the NAND flash
* @mtd: MTD device structure
mtd->_block_isreserved = nand_block_isreserved;
mtd->_block_isbad = nand_block_isbad;
mtd->_block_markbad = nand_block_markbad;
- mtd->_max_bad_blocks = nand_max_bad_blocks;
+ mtd->_max_bad_blocks = nanddev_mtd_max_bad_blocks;
/*
* Initialize bitflip_threshold to its default prior scan_bbt() call.
memorg->bits_per_cell = p->bits_per_cell;
chip->bits_per_cell = p->bits_per_cell;
- chip->max_bb_per_die = le16_to_cpu(p->bb_per_lun);
- chip->blocks_per_die = le32_to_cpu(p->blocks_per_lun);
-
if (le16_to_cpu(p->features) & ONFI_FEATURE_16_BIT_BUS)
chip->options |= NAND_BUSWIDTH_16;
* @id: [INTERN] holds NAND ID
* @parameters: [INTERN] holds generic parameters under an easily
* readable form.
- * @max_bb_per_die: [INTERN] the max number of bad blocks each die of a
- * this nand device will encounter their life times.
- * @blocks_per_die: [INTERN] The number of PEBs in a die
* @data_interface: [INTERN] NAND interface timing information
* @cur_cs: currently selected target. -1 means no target selected,
* otherwise we should always have cur_cs >= 0 &&
struct nand_id id;
struct nand_parameters parameters;
- u16 max_bb_per_die;
- u32 blocks_per_die;
struct nand_data_interface data_interface;