media: ov5640: Add register definition for test pattern register
authorChen-Yu Tsai <wens@csie.org>
Fri, 18 Jan 2019 08:52:02 +0000 (03:52 -0500)
committerMauro Carvalho Chehab <mchehab+samsung@kernel.org>
Mon, 18 Feb 2019 16:28:20 +0000 (11:28 -0500)
commita0c29afb506445e449713afd55e5f149b3d63b79
tree01f33b4b9abc66cf3ffc74e15154f25d5699611c
parent9f6d7bacc726f4809170291072589dd9e62d4a3c
media: ov5640: Add register definition for test pattern register

The OV5640 can generate many types of test patterns, some with
additional modifiers, such as a rolling bar, or gamma gradients.

Add the bit definitions for all bits in the test pattern register,
and use them to compose the values to be written to the register.

Signed-off-by: Chen-Yu Tsai <wens@csie.org>
Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com>
Signed-off-by: Mauro Carvalho Chehab <mchehab+samsung@kernel.org>
drivers/media/i2c/ov5640.c